Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy

Sample thickness determination by scanning transmission electron microscopy at low electron energies.

Sample thickness is a decisive parameter for any quantification of image information and composition in transmission electron microscopy. In this context, we present a method to determine the local sample thickness by scanning transmission electron microscopy at primary energies below 30 keV. The image intensity is measured with respect to the intensity of the incident electron beam and can be ...

Thin dielectric film thickness determination by advanced transmission electron microscopy.

High-resolution transmission electron microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by nonspecialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annul...

15. Scanning Transmission Electron Microscopy

Scanning Electron Microscopy (SEM) analysis and biological control of Ixodes ricinus using entomopathogenic fungi

In the present study, pathogenicity of four native strains of Entomopathogenic fungus; Metarhizium anisopliae, was studied against adult stage of Ixodes ricinus. For this purpose a total number of 180 adult ticks were examined in triplicate. Thirty ticks for each strain and negative and positive controls were immersed in 2.4×107 fungal conidia/ml in vitro. Samples were incubated in separate Pet...

Scanning transmission low-energy electron microscopy

We discuss an extension to the transmission mode of the cathode-lens-equipped scanning electron microscope, enabling operation down to the lowest energies of electrons. Penetration of electrons through free-standing ultrathin films is examined along the full energy scale, and the contribution of the secondary electrons (SEs), released near the bottom surface of the sample, is shown, enhancing t...